Electron Microscopy Platform
Advanced Electron Microscopy and Analytical Capabilities for Cutting-Edge Research
Electron Microscopy Platform enables scientific discoveries and technological innovations by providing researchers and industrial partners with cutting-edge electron microscopy tools, combining ultimate resolution, analytical versatility, and technical expertise.
Key Capabilities
Scanning Electron Microscopy
The system delivers high-resolution imaging down to 1 nanometer at a 10 mm analytical working distance, combined with live elemental imaging and compositional information through EDS. Equipped with SmartAlign Technology, the optics system automatically aligns itself, ensuring optimal performance, ease of use, and reliable analytical results.
Focused Ion Beam Scanning Electron Microscopy
These systems combine precise FIB sample modification with high-resolution SEM imaging. They support Ga⁺ and plasma FIB technologies, mainly for TEM sample preparation, with lamellae down to 20 nm. The platform enables automated preparation, large-scale plasma milling, 3D slice-and-view analysis, and advanced characterization using EDS and EBSD, as well as nanoprototyping.
Transmission Electron Microscopy
This system is one of the most advanced commercial TEMs on the market, operating at a high accelerating voltage of 300 kV. It features double aberration correction and supports both high-resolution TEM and STEM modes. Advanced capabilities include electron diffraction mapping, a large-area EDS detector, EELS analysis, and sub-atomic spatial resolution.